Monte Carlo Modeling For Electron Microscopy And Microanalysis (Monte Carlo Modelling For Electron Microscopy & Microanalysi)

Monte Carlo Modeling For Electron Microscopy And Microanalysis (Monte Carlo Modelling For Electron Microscopy & Microanalysi)

  • Used Book in Good Condition
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This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.

  • Used Book in Good Condition
Author

David C. Joy

Binding

Hardcover

Brand

Brand: Oxford University Press, USA

EAN

9780195088748

ISBN

0195088743

Label

Oxford University Press

Manufacturer

Oxford University Press

NumberOfPages

224

ProductGroup

Book

ProductTypeName

ABIS_BOOK

PublicationDate

1995-04-13

Publisher

Oxford University Press

Studio

Oxford University Press

Monte Carlo Modeling for Electron Microscopy and Microanalysis (Monte Carlo Modelling for Electron Microscopy & Microanalysi)

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