Scanning Force Microscopy: With Applications To Electric, Magnetic, And Atomic Forces (Oxford Series In Optical & Imaging Sciences)

Scanning Force Microscopy: With Applications To Electric, Magnetic, And Atomic Forces (Oxford Series In Optical & Imaging Sciences)

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Scanning Force Microscopy: With Applications To Electric, Magnetic, And Atomic Forces (Oxford Series In Optical & Imaging Sciences) is a part of Scanning Electron Microscope Uses products library. To see this Scanning Force Microscopy: With Applications To Electric, Magnetic, And Atomic Forces (Oxford Series In Optical & Imaging Sciences) in stock for product, click the link above and come over and then you will get this item about Scanning Force Microscopy: With Applications To Electric, Magnetic, And Atomic Forces (Oxford Series In Optical & Imaging Sciences) .


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Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

    Author

    Dror Sarid

    Binding

    Hardcover

    EAN

    9780195092042

    Edition

    Rev Sub

    ISBN

    019509204X

    Label

    Oxford University Press

    Manufacturer

    Oxford University Press

    NumberOfPages

    288

    ProductGroup

    Book

    ProductTypeName

    ABIS_BOOK

    PublicationDate

    1994-08-25

    Publisher

    Oxford University Press

    Studio

    Oxford University Press

    Scanning Force Microscopy: With Applications to Electric Magnetic and Atomic Forces (Oxford Series in Optical & Imaging Sciences)

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