Encyclopedia Of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series)

Encyclopedia Of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series)

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Encyclopedia Of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series) is a part of Mechanical Stage Microscope products library. To see this Encyclopedia Of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series) in stock for product, click the link above and come over and then you will get this item about Encyclopedia Of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series) .


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Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.

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Author

Charles Evans

Author

Richard Brundle

Author

Wilson

Binding

Hardcover

Brand

Example Product Brand

EAN

9780750691680

Format

Braille

ISBN

0750691689

Label

Butterworth-Heinemann

Manufacturer

Butterworth-Heinemann

NumberOfPages

800

ProductGroup

Book

ProductTypeName

ABIS_BOOK

PublicationDate

1992-09-01

Publisher

Butterworth-Heinemann

Studio

Butterworth-Heinemann

Encyclopedia of Materials Characterization: Surfaces Interfaces Thin Films (Materials Characterization Series)

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