Applied Scanning Probe Methods Ii: Scanning Probe Microscopy Techniques (Nanoscience And Technology) (V. 2)

Applied Scanning Probe Methods Ii: Scanning Probe Microscopy Techniques (Nanoscience And Technology) (V. 2)

  • Used Book in Good Condition
Add to cart

Product Description


Applied Scanning Probe Methods Ii: Scanning Probe Microscopy Techniques (Nanoscience And Technology) (V. 2) is a part of Kelvin Probe Force Microscopy products library. To see this Applied Scanning Probe Methods Ii: Scanning Probe Microscopy Techniques (Nanoscience And Technology) (V. 2) in stock for product, click the link above and come over and then you will get this item about Applied Scanning Probe Methods Ii: Scanning Probe Microscopy Techniques (Nanoscience And Technology) (V. 2) .


This specific product of Applied Scanning Probe Methods Ii: Scanning Probe Microscopy Techniques (Nanoscience And Technology) (V. 2) posted by Benitez. You can see a library of Kelvin Probe Force Microscopy. Get segments interesting article about Kelvin Probe Force Microscopy that may help you. If you're making an attempt to seek out Applied Scanning Probe Methods Ii: Scanning Probe Microscopy Techniques (Nanoscience And Technology) (V. 2) with the easiest value. $ead the review on Applied Scanning Probe Methods Ii: Scanning Probe Microscopy Techniques (Nanoscience And Technology) (V. 2), it's reasonable price. Thanks for your visit Best Telephoto Online Store.


Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

  • Used Book in Good Condition
Binding

Hardcover

Brand

Brand: Springer

Creator

Bharat Bhushan

Creator

Harald Fuchs

EAN

9783540262428

Edition

2006

ISBN

3540262423

Label

Springer

Manufacturer

Springer

NumberOfPages

420

ProductGroup

Book

ProductTypeName

ABIS_BOOK

PublicationDate

2006-02-21

Publisher

Springer

Studio

Springer

Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology) (v. 2)

reviews for Applied Scanning Probe Methods Ii: Scanning Probe Microscopy Techniques (Nanoscience And Technology) (V. 2)

Add a review

Powered by Buy Telephoto Shop

Desk Store| Watches Store| Baby Store| BBQ Store

Your search for the very best in product, top quality telephoto ends here! That's why we do all we can to save you money on telephoto.

http://www.telephotostorehq.ddns.info is a participant in the Amazon Services LLC Associates Program, an affiliate advertising program designed to provide a means for sites to earn advertising fees by advertising and linking to Amazon.com. Amazon, the Amazon logo, AmazonSupply, and the AmazonSupply logo are trademarks of Amazon.com, Inc. or its affiliates.